Some selected publications (sorted in reverse chronological order):

D. B. Lavo, B. Chess, T. Larrabee, and F. J. Ferguson, Diagnosing Realistic Bridging Faults with Single Stuck-At Information. IEEE Transactions on Computer-Aided Design, 255-268, March, 1998.

Douglas Williams, F. J. Ferguson, T. Larrabee, A Study on the Utility of using Expected Quality Level as a Design for Testability Metric. In Proceedings of the 16th VLSI Test Symposium, 274-282, March 1998.

B. Chess T. Larrabee. Testing Bridging Faults in CMOS Integrated Circuits. Transactions on computers, March 1998.

D. B. Lavo, B. Chess, T. Larrabee, F. J. Ferguson, Jayashree Saxena, and Kenneth Butler. Bridging Fault Diagnosis in the Absence of Physical Information. In Proceedings of the International Test Conference, 887-893, November 1997.

H. Konuk F. J. Ferguson, and T. Larrabee, Charge-based fault simulation for CMOS network breaks. IEEE Transactions on Computer-Aided Design, 1555-1567, December 1996.

D. B. Lavo, T. Larrabee, and B. Chess, . Beyond the Byzantine Generals: Unexpected Behavior and Bridging Fault Diagnosis Proceedings of the International Test Conference, 611-619, October 1996.

B. Chess, D. B. Lavo, F.J. Ferguson, and T. Larrabee. Diagnosis of Realistic Bridging Faults with Single Stuck-at Information. In Proceedings of the International Conference on Computer Aided Design , pages 185-192, 1995.

H. Konuk, F.J. Ferguson, and T. Larrabee. Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. In Proceedings of the Design Automation Conference, pages 345-351, 1995.

B. Chess, A Freitas, F.J. Ferguson, and T. Larrabee. Testing CMOS Logic Gates for Realistic Shorts. In Proceedings of the International Test Conference, pages 395-401, 1994.

B. Chess, C. Roth, and T. Larrabee On Evaluating competing bridge fault models for CMOS ICs. In Proceedings of the 12th VLSI Test Symposium, pages 446-451, 1994.

B. Chess and T. Larrabee. Generating test patterns for bridge faults in CMOS ICs. In Proceedings of the European Test Conference , pages 165-170, 1994.

B. Chess and T. Larrabee. Bridge Fault Simulation Strategies for CMOS Integerated Circuits. In Proceedings of the Design Automation Conference, pages 458-462, 1993.

H. Konuk, and T. Larrabee. Explorations of Sequential ATPG Using Boolean Satisfiability. In Proceedings of the 11th VLSI Test Symposium, pages 85-90, 1993.

T. Larrabee and Y. Tsuji. Evidence for a Satisfiability Threshold for Random 3CNF Formulas. In Proceedings of the AAAI Symposium on AI and NP-Hard Problems, 1992.

T. Larrabee. Test Pattern Generation Using Boolean Satisfiability. In 1992. IEEE Transactions on Computer-Aided Design, pages 4-15, Jan, 1992.

F.J. Ferguson, and T. Larrabee. Test Pattern Generation for Realistic Bridge Faults in CMOS ICs, . In Proceedings of the International Test Conference, pages 492-499, 1991.

F.J. Ferguson, M. Taylor, and T. Larrabee. Testing for Parametric Faults in Static CMOS Circuits. In Proceedings of the International Test Conference, pages 436-443, 1990.


SCTEST Group / CE/CIS Boards / UC Santa Cruz